The NanoInnovation 2020 SPM School is mainly intended for  graduate and PhD students as well as young scientists interested in deepening their knowledge about advanced SPM methods, but it is also open to all researchers and scientists who are involved in the different fields characterizations methods for nanotechnology and nanosciences.

As for all the NanoInnovation events, the attendance to the NanoInnovation 2020 SPM School is free and the interested attendees are requested to register using the NanoInnovation website selecting the option “SPM School” in the online form. 

ROOM 6
Wednesday 16 September
I. Nanomechanical mapping Chair: Daniele PASSERI - CV
10:45 - 11:00	Welcome and Introduction Daniele PASSERI - CV, Sapienza University
11:00 - 11:45	Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications Ricardo GARCIA - CV, CSIC
11:45 - 12:30	The utilization of fast AFM’s tip-sample interaction for the surface morphology imaging and mechanical properties mapping Andrzej SIKORA - CV, Wroclaw University of Science and Technology
Break time
II. Electric and thermal phenomena in 2D materials Chair: Andrzej SIKORA - CV
14:00 - 14:45	Exploration of nanoscale thermal transport and thermoelectric phenomena in 2D materials via scanning probes Oleg KOLOSOV - CV, Lancaster University
14:45 - 15:30	Electrical SPM for 2D materials Umberto CELANO - CV, IMEC
Break time
III. From atoms to molecules Chair: Francesco MARINELLO
16:00 - 16:45	Atomically Precise Molecular Design: Insights From Sub-molecular Resolution Scanning Probe Microscopy Samuel JARVIS - CV, Lancaster University
16:45 - 17:30	Self-organization of complete organic monolayers via sequential post-deposition annealing: an investigation by Scanning Probe Microscopy Cristiano ALBONETTI - CV, CNR
ROOM 6
Thursday 17 September
IV. Toward tomography Chair: Andrzej SIKORA - CV
11:00 - 11:45	3D tomographic AFM using Scalpel SPM Umberto CELANO - CV, IMEC
11:45 - 12:30	Nanoscale 3D imaging of physical properties of materials  Oleg KOLOSOV - CV, Lancaster University
Break time
V. Pre- and post-eperiment issues Chair: Daniele PASSERI - CV
14:00 - 14:45	Correlative microscopy – the issue of precise positioning of the sample and its impact on the experiment outcome Andrzej SIKORA - CV, Wroclaw University of Science and Technology
14:45 - 15:30	Data processing in SPM Francesco MARINELLO - CV, University of Padua
Break time
VI. Nanomagnetic characterizations Chair: Umberto CELANO  - CV
16:00 - 16:45	Characterization of nanomagnets by Advanced Magnetic Force Microcopy Agustina ASENJO - CV, CSIC
16:45 - 17:30	Direct and Indirect Magnetic Force Microscopy in Histology Gunjan AGARWAL - CV, The Ohio State University
ROOM 6
Friday 18 September
VII. Nanoelectric characterizations Chair: Francesco MARINELLO
11:00 - 11.45	Carrier profiling with SPM application in Nanoelectronics Umberto CELANO - CV, IMEC
11:45 - 12:30	Electrical nano-characterization of wide band gap semiconductors (silicon carbide) devices by scanning probe microscopy Patrick FIORENZA - CV, CNR
Break time
VIII.Tunneling and spectroscopies Chair: Umberto CELANO - CV
14:00 - 14:45	Basic principles of STM/S and applications to condensed matter physics Fabrizio BOBBA - CV, University of Salerno
14:45 - 15:30	AFM-assisted infrared nanospectroscopy Leonetta BALDASSARRE - CV, Sapienza University
Break time
IX. Multiferroics Chair: Daniele PASSERI - CV
16:00 - 16:45	Ferromagnetic, ferroelectric and multiferroic nanostructures. AFM characterisation Bernard NYSTEN - CV, UCLouvain
16:45 - 17:30	SPM techniques for ferroelectric materials characterization Francisco FLORES RUIZ - CV, Benemérita Universidad Autónoma de Puebla